IP Library Assignment 025785/0064
Patent Assignment
Reel/Frame 025785/0064

Assignment of Assignor's Interest

Recorded: 2011-02-09 Pages: 8
Assignors
ABBADIE, ALEXANDRA
Executed: 2010-11-30
KOLBESEN, BERND
Executed: 2010-11-18
MAEHLISS, JOCHEN
Executed: 2010-11-18
Assignee
S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES
PARC TECHNOLOGIQUE DES FONTAINES, F-38190 BERNIN, FRANCE
Covered Property (1)
Etching Composition, in Particular for Strained or Stressed Silicon Materials, Method for Characterizing Defects on Surfaces of Such Materials and Process of Treating Such Surfaces with the Etching Composition
Patent: 9,063,043 →
Application: 12/989,217 →
Publication: US 2011/0104905
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Mar 4, 2012
From: S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES
To: SOITEC
Reel/Frame 027800/0911 →