IP Library Assignment 025785/0330
Patent Assignment
Reel/Frame 025785/0330

Assignment of Assignor's Interest

Recorded: 2011-02-09 Pages: 2
Assignors
WATANABE, DAISUKE
Executed: 2010-12-15
OKAYASU, TOSHIYUKI
Executed: 2010-12-15
Assignee
ADVANTEST CORPORATION
1-32-1, ASAHI-CHO, NERIMA-KU, TOKYO, 179-0071, JAPAN
Covered Property (1)
Wafer Unit for Testing and Test System
Patent: 8,610,449 →
Application: 12/954,565 →
Publication: US 2011/0128027
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Dec 18, 2018
From: ADVANTEST CORPORATION
To: ADVANTEST CORPORATION
Reel/Frame 047987/0626 →