IP Library › Assignment 025791/0367
Patent Assignment
Reel/Frame 025791/0367

Assignment of Assignor's Interest

Recorded: 2011-02-11 Pages: 2
Assignors
NAKANO, TOMONORI
Executed: 2011-01-17
KAWASAKI, TAKESHI
Executed: 2011-01-21
HIROSE, KOTOKO
Executed: 2011-01-18
ITO, HIROYUKI
Executed: 2011-01-18
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Apparatus and Geometrical Aberration Measurement Method Therefor
Patent: 8,581,190 →
Application: 13/058,540 →
Publication: US 2011/0139980
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →