Patent Assignment
Reel/Frame 025812/0313
Assignment of Assignor's Interest
Recorded: 2011-02-15
Pages: 3
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
X-Ray Analyzer and Mapping Method for an X-Ray Analysis
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.