IP Library › Assignment 025830/0906
Patent Assignment
Reel/Frame 025830/0906

Assignment of Assignor's Interest

Recorded: 2011-02-18 Pages: 2
Assignors
FUKAYA, RITSUO
Executed: 2011-01-28
OKAI, NOBUHIRO
Executed: 2011-02-01
MIYAHARA, KOKI
Executed: 2011-01-25
WANG, ZHIGANG
Executed: 2011-01-31
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method for Controlling Charging of Sample and Scanning Electron Microscope
Patent: 8,487,251 →
Application: 13/059,537 →
Publication: US 2011/0139981
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →