IP Library › Assignment 025867/0197
Patent Assignment
Reel/Frame 025867/0197

Assignment of Assignor's Interest

Recorded: 2011-02-25 Pages: 3
Assignors
HIROI, TAKASHI
Executed: 2011-02-17
GUNJI, YASUHIRO
Executed: 2011-02-17
MIYAI, HIROSHI
Executed: 2011-02-17
NOJIRI, MASAAKI
Executed: 2011-02-17
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
1-24-14, NISHI SHINBASHI, MINATO-KU,, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Device for Scanning a Sample Using a Charged Particle Beam to Inspect the Sample
Patent: 8,421,010 →
Application: 13/061,031 →
Publication: US 2011/0163230
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →