IP Library › Assignment 025903/0402
Patent Assignment
Reel/Frame 025903/0402

Assignment of Assignor's Interest

Recorded: 2011-03-04 Pages: 3
Assignors
SHINODA, SHINICHI
Executed: 2010-12-01
TOYODA, YASUTAKA
Executed: 2010-12-06
MATSUOKA, RYOICHI
Executed: 2010-12-07
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14 NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Inspection Method, Pattern Inspection Apparatus and Pattern Processing Apparatus
Patent: 8,705,841 →
Application: 12/997,176 →
Publication: US 2011/0142326
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →