Patent Assignment
Reel/Frame 026133/0221
Assignment of Assignor's Interest
Recorded: 2011-04-15
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Defect Check Method and Device Thereof
Application:
13/058,223 →
Publication:
US 2011/0182496
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.