IP Library › Assignment 026195/0229
Patent Assignment
Reel/Frame 026195/0229

Assignment of Assignor's Interest

Recorded: 2011-04-28 Pages: 3
Assignors
FUJISAWA, AKIKO
Executed: 2011-04-14
KOBAYASHI, HIROYUKI
Executed: 2011-04-14
NAKAZAWA, EIKO
Executed: 2011-04-14
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14 NISHI SHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method for Observing Sample and Electronic Microscope
Patent: 9,013,572 →
Application: 13/126,638 →
Publication: US 2011/0205353
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →