Patent Assignment
Reel/Frame 026199/0021
Assignment of Assignor's Interest
Recorded: 2011-04-29
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SINBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property
(1)
Measuring Method of Pattern Dimension and Scanning Electron Microscope Using Same
Application:
13/126,768 →
Publication:
US 2011/0208477
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.