IP Library › Assignment 026241/0438
Patent Assignment
Reel/Frame 026241/0438

Change of Name

Recorded: 2011-05-08 Pages: 2
Assignor
Assignee
CHARTERED SEMICONDUCTOR MANUFACTURING PTE. LTD.
60 WOODLANDS INDUSTRIAL PARK D STREET 2, SINGAPORE, 738406, SINGAPORE
Covered Property (1)
Multi-Variable Regression for Metrology
Patent: 7,966,142 →
Application: 12/103,690 →
Publication: US 2009/0258445
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 15, 2008
From: ZHOU, WEN ZHAN; ZOU, ZHENG; GOH, JASPER; ZHOU, MEI SHENG
To: CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
Reel/Frame 020807/0351 →
Change of Name May 8, 2011
From: CHARTERED SEMICONDUCTOR MANUFACTURING PTE. LTD.
To: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
Reel/Frame 026241/0446 →
Security Agreement Nov 27, 2018
From: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 047660/0203 →
Release of Security Interest Nov 19, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
Reel/Frame 054481/0673 →