Patent Assignment
Reel/Frame 026353/0098
Assignment of Assignor's Interest
Recorded: 2011-05-27
Pages: 3
Assignee
TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.
19900 MACARTHUR BLVD., SUITE 400, IRVINE, CALIFORNIA, 92612
Covered Property
(1)
Specific Contact Resistivity Measurement Method, Semiconductor Device for Specific Contact Resistivity Measurement, and Method for Manufacturing the Same
Application:
13/070,704 →
Publication:
US 2012/0242356
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.