IP Library Assignment 026371/0798
Patent Assignment
Reel/Frame 026371/0798

Assignment of Assignor's Interest

Recorded: 2011-06-01 Pages: 2
Assignors
KU, KIE-BONG
Executed: 2011-04-22
LEE, LEE-BUM
Executed: 2011-04-22
Assignee
HYNIX SEMICONDUCTOR INC.
SAN 136-1, AMI-RI, BUBAL-EUP, ICHEON-SI, GYEONGGI-DO, 467-701, KOREA, REPUBLIC OF
Covered Property (1)
Method and System for Testing Semiconductor Device
Patent: 8,922,235 →
Application: 13/150,782 →
Publication: US 2012/0153984
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 28, 2014
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 034496/0181 →
Assignment of Assignor's Interest May 7, 2024
From: SK HYNIX INC.
To: MIMIRIP LLC
Reel/Frame 067335/0246 →