Method and system for testing semiconductor device

1. A method for testing a semiconductor device, comprising:

testing the semiconductor device in a plurality of operation modes sequentially; and

programming the semiconductor device to operate in at least one of the operation modes when the semiconductor device passes the testing.

2. The method of claim 1 , wherein the testing of the semiconductor device in the plurality of test modes sequentially comprises testing an operation of the semiconductor device in a first operation mode.

3. The method of claim 2 , further comprising:

terminating the testing of the semiconductor device if the semiconductor passes the testing in the first operation mode; and

testing the operation of the semiconductor device in a second operation mode if the semiconductor device fails the testing in the first operation mode.

4. The method of claim 3 , further comprising:

programming the semiconductor device to operate in the second operation mode if the semiconductor device passes the testing in the second operation mode; and

testing the operation of the semiconductor device in a third operation mode if the semiconductor device fails the testing in the second operation mode.

5. The method of claim 4 , further comprising:

programming the semiconductor device to operate in the third operation mode if the semiconductor device passes the testing in the third operation mode; and

terminating the testing of the semiconductor device if the semiconductor device fails the testing in the third operation mode.

6. The method of claim 4 , wherein conditions to pass for the semiconductor device become progressively easier in going from the first operation mode to the third operation mode.

7. The method of claim 1 , where the operation modes includes a normal operation mode and a test operation mode of the semiconductor device.

8. The method of claim 1 , further comprising terminating the testing of the semiconductor device when the semiconductor device passes the testing in at least one of the operation modes.

9. The method of claim 1 , wherein conditions to pass for the semiconductor device become progressively easier in going from the first one to the last one of the operation modes.

10. The method of claim 1 , further comprising terminating the testing of the semiconductor device when the semiconductor device fails the testing in the plurality of operation modes.