IP Library › Assignment 026406/0633
Patent Assignment
Reel/Frame 026406/0633

Assignment of Assignor's Interest

Recorded: 2011-06-07 Pages: 3
Assignors
LEE, HOI-JIN
Executed: 2011-05-06
KONG, BAI-SUN
Executed: 2011-05-04
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416 MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property (1)
Scan Flip-Flop Circuits and Scan Test Circuits Including the Same
Patent: 8,441,279 →
Application: 13/154,731 →
Publication: US 2011/0304353