Assignment of Assignor's Interest

Recorded: 2011-06-07 Pages: 3

Assignors

NISHINAKA, KENICHI

Executed: 2011-04-18

OGAWA, TAKASHI

Executed: 2011-04-18

KOYAMA, YOSHIHIRO

Executed: 2011-04-18

Assignee

SII NANOTECHNOLOGY INC.

8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN

Covered Property (1)

Focused ion beam apparatus

Patent: 8,822,945 →

Application: 13/065,698 →

Publication: US 2011/0233401

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.