IP Library Assignment 026499/0339
Patent Assignment
Reel/Frame 026499/0339

Assignment of Assignor's Interest

Recorded: 2011-06-24 Pages: 3
Assignors
HABERLA, HOLGER
Executed: 2011-06-22
LOHBRANDT, SOEREN
Executed: 2011-06-22
Assignee
X-FAB SEMICONDUCTOR FOUNDRIES AG
HAARBERGSTRASSE 67, ERFURT, 99097, GERMANY
Covered Property (1)
System and Method for Testing Embedded Circuits with Test Islands
Patent: 7,994,806 →
Application: 11/817,066 →
Publication: US 2010/0026334