Patent Assignment
Reel/Frame 026511/0722
Assignment of Assignor's Interest
Recorded: 2011-06-28
Pages: 3
Assignors
KAMEDA, YOSHIO
Executed: 2011-05-30
NAKAGAWA, YOSHIHIRO
Executed: 2011-05-30
NOGUCHI, KOICHIRO
Executed: 2011-05-30
MIZUNO, MASAYUKI
Executed: 2011-05-30
NOSE, KOICHI
Executed: 2011-05-30
Assignee
NEC CORPORATION
7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Semiconductor Device and Method of Testing the Same