Patent Assignment
Reel/Frame 026648/0988
Assignment of Assignor's Interest
Recorded: 2011-07-26
Pages: 2
Assignors
MAEDA, SHUNJI
Executed: 2011-06-23
SAKAI, KAORU
Executed: 2011-06-23
NISHIYAMA, HIDETOSHI
Executed: 2011-06-30
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Defect Inspection Method and Device Thereof