IP Library › Assignment 026684/0041
Patent Assignment
Reel/Frame 026684/0041

Assignment of Assignor's Interest

Recorded: 2011-08-02 Pages: 2
Assignors
MATSUI, TAKUYA
Executed: 2011-06-30
TAKAHASHI, SATOSHI
Executed: 2011-06-30
HAGA, TAKANOBU
Executed: 2011-07-03
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHINBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property (1)
Total Internal Reflection Microscope Apparatus and Method for Analyzing Fluorescent Sample
Patent: 8,362,449 →
Application: 13/147,386 →
Publication: US 2011/0284769
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →