IP Library › Assignment 026701/0286
Patent Assignment
Reel/Frame 026701/0286

Assignment of Assignor's Interest

Recorded: 2011-08-04 Pages: 2
Assignors
KOTAKI, GO
Executed: 2011-07-01
MIYAMOTO, ATSUSHI
Executed: 2011-06-30
NAKAGAKI, RYO
Executed: 2011-07-11
HIRAI, TAKEHIRO
Executed: 2011-07-11
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Observation Method and Device Using Sem
Patent: 9,082,585 →
Application: 13/143,345 →
Publication: US 2011/0285839
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →