IP Library › Assignment 026716/0196
Patent Assignment
Reel/Frame 026716/0196

Assignment of Assignor's Interest

Recorded: 2011-08-08 Pages: 2
Assignors
HARADA, MINORU
Executed: 2011-07-21
NAKAGAKI, RYO
Executed: 2011-07-26
OBARA, KENJI
Executed: 2011-07-26
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Observation Method and Defect Observation Apparatus
Patent: 8,634,634 →
Application: 13/146,032 →
Publication: US 2011/0299760
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →