IP Library › Assignment 026730/0045
Patent Assignment
Reel/Frame 026730/0045

Assignment of Assignor's Interest

Recorded: 2011-08-10 Pages: 2
Assignors
OMORI, SEIKO
Executed: 2011-06-29
CHENG, ZHAOHUI
Executed: 2011-07-07
KAZUMI, HIDEYUKI
Executed: 2011-07-23
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Sample Observing Method and Scanning Electron Microscope
Patent: 8,309,923 →
Application: 13/148,864 →
Publication: US 2011/0303843
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →