IP Library Assignment 026876/0544
Patent Assignment
Reel/Frame 026876/0544

Assignment of Assignor's Interest

Recorded: 2011-09-08 Pages: 3
Assignors
MORINO, KOICHI
Executed: 2011-08-25
IKEDA, KOUICHI
Executed: 2011-08-25
Assignee
RICOH COMPANY, LTD.
3-6, NAKAMAGOME 1-CHOME, OHTA-KU, TOKYO, 143-8555, JAPAN
Covered Property (1)
Device and Method for Testing Semiconductor Device
Patent: 8,917,103 →
Application: 13/198,879 →
Publication: US 2012/0032696
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 18, 2015
From: RICOH COMPANY, LTD.
To: RICOH ELECTRONIC DEVICES CO., LTD.
Reel/Frame 035011/0219 →