Patent Assignment
Reel/Frame 027057/0652
Assignment of Assignor's Interest
Recorded: 2011-10-13
Pages: 2
Assignors
YOSHITAKE, YASUHIRO
Executed: 2011-07-17
YOSHIDA, MINORU
Executed: 2011-07-21
OKA, KEIKO
Executed: 2011-07-21
Assignee
HITACHI, LTD.
6-6, MARUNOUCHI 1-CHOME, CHIYODA-KU,, TOKYO, JAPAN
Covered Property
(1)
Wavefront Aberration Measuring Method and Device Therefor