IP Library › Assignment 027064/0558
Patent Assignment
Reel/Frame 027064/0558

Assignment of Assignor's Interest

Recorded: 2011-10-14 Pages: 3
Assignors
FANG, WEI
Executed: 2011-10-05
ZHANG, ZHAO-LI
Executed: 2011-10-05
JAU, JACK
Executed: 2011-10-05
Assignee
HERMES MICROVISION, INC.
7F, NO. 18, PUDING RD., HSINCHU CITY, 300, TAIWAN
Covered Property (1)
Method and System of Classifying Defects on a Wafer
Patent: 8,805,054 →
Application: 13/269,038 →
Publication: US 2012/0027287
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 29, 2020
From: HERMES MICROVISION, INC.
To: HERMES MICROVISION INCORPORATED B.V.
Reel/Frame 054866/0742 →
Assignment of Assignor's Interest Dec 29, 2020
From: HERMES MICROVISION INCORPORATED B.V.
To: ASML NETHERLANDS B.V.
Reel/Frame 054870/0156 →