Patent Assignment
Reel/Frame 027129/0037
Assignment of Assignor's Interest
Recorded: 2011-10-27
Received: 2011-10-27
Pages: 2
Assignor
KOZU, KATSUMI
Executed: 2011-06-12
Assignee
PANASONIC CORPORATION
1006 OAZA KADOMA, KADOMA-SHI, OSAKA, JPX, 571-8501, JAPAN
Covered Properties
(2)
Delay Fault Test Quality Calculation Apparatus, Delay Fault Test Quality Calculation Method, and Delay Fault Test Pattern Generation Apparatus
Application:
13/243,070 →
Battery Module
Application:
13/147,998 →