IP Library Assignment 027276/0258
Patent Assignment
Reel/Frame 027276/0258

Assignment of Assignor's Interest

Recorded: 2011-11-23 Pages: 3
Assignor
KAWASAKI, TAKAHIRO
Executed: 2011-10-17
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Scanning Electron Microscope Device, Evaluation Point Generating Method, and Program
Patent: 8,742,375 →
Application: 13/322,394 →
Publication: US 2012/0104251
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →