IP Library › Assignment 027325/0185
Patent Assignment
Reel/Frame 027325/0185

Assignment of Assignor's Interest

Recorded: 2011-12-05 Pages: 2
Assignors
TANIGUCHI, ATSUSHI
Executed: 2011-11-24
SHIBATA, YUKIHIRO
Executed: 2011-11-24
UENO, TAKETO
Executed: 2011-11-24
NAKATA, TOSHIHIKO
Executed: 2011-11-25
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Apparatus Therefor
Patent: 8,885,037 →
Application: 13/375,239 →
Publication: US 2012/0092484
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →