Patent Assignment
Reel/Frame 027327/0670
Assignment of Assignor's Interest
Recorded: 2011-12-05
Pages: 3
Assignee
HERMES MICROVISION INC.
7F, NO.18, PUDING RD., EAST DIST., HSINCHU CITY, 300, TAIWAN
Covered Property
(1)
Method for Inspecting Overlay Shift Defect During Semiconductor Manufacturing and Apparatus Thereof
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.