IP Library › Assignment 027399/0333
Patent Assignment
Reel/Frame 027399/0333

Assignment of Assignor's Interest

Recorded: 2011-12-16 Pages: 2
Assignor
LEE, CHANG-HWAN
Executed: 2011-12-02
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416 MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property (1)
Tester to Test a Plurality of Semiconductor Devices and Test System Including the Same
Patent: 8,860,452 →
Application: 13/328,004 →
Publication: US 2012/0153982