Patent Assignment
Reel/Frame 027423/0261
Assignment of Assignor's Interest
Recorded: 2011-12-21
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property
(1)
Charged-Particle Microscope Device and Method for Inspecting Sample Using Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.