IP Library Assignment 027450/0938
Patent Assignment
Reel/Frame 027450/0938

Assignment of Assignor's Interest

Recorded: 2011-12-28 Pages: 2
Assignors
HARADA, MINORU
Executed: 2011-11-23
TAKAGI, YUJI
Executed: 2011-11-23
HAMAMURA, YUICHI
Executed: 2011-11-29
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Reviewed Defect Selection Processing Method, Defect Review Method, Reviewed Defect Selection Processing Tool, and Defect Review Tool
Patent: 8,675,949 →
Application: 13/266,800 →
Publication: US 2012/0093392
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →