IP Library › Assignment 027504/0642
Patent Assignment
Reel/Frame 027504/0642

Assignment of Assignor's Interest

Recorded: 2012-01-10 Pages: 2
Assignors
KOTAKI, GO
Executed: 2011-12-09
MIYAMOTO, ATSUSHI
Executed: 2011-12-07
MATSUOKA, RYOICHI
Executed: 2011-12-19
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME,, MINATO-KU, TOKYO,, JAPAN
Covered Property (1)
Scanning Electron Microscope Device and Pattern Dimension Measuring Method Using Same
Patent: 9,343,264 →
Application: 13/379,042 →
Publication: US 2012/0098953
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →