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Patent Assignment
Reel/Frame 027506/0399

Assignment of Assignor's Interest

Recorded: 2012-01-10 Pages: 2
Assignor
SAITO, TOSHIHIKO
Executed: 2011-12-20
Assignee
SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
398, HASE, ATSUGI-SHI, KANAGAWA-KEN, 243-0036, JAPAN
Covered Property (1)
Memory Device, Semiconductor Device, and Detecting Method for Defective Memory Cell in Memory Device
Patent: 8,687,411 →
Application: 13/344,652 →
Publication: US 2012/0182789