Patent Assignment
Reel/Frame 027517/0647
Assignment of Assignor's Interest
Recorded: 2012-01-11
Pages: 3
Assignors
ISHIJIMA, TATSUAKI
Executed: 2011-10-26
NASU, OSAMU
Executed: 2011-12-09
FUKUDA, MUNEYUKI
Executed: 2011-10-28
OHASHI, TAKEYOSHI
Executed: 2011-10-28
YAMANASHI, HIROMASA
Executed: 2011-11-15
MIYAMOTO, TAKUJI
Executed: 2011-10-26
SAKAI, KEI
Executed: 2011-10-27
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Specimen Potential Measuring Method, and Charged Particle Beam Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.