IP Library › Assignment 027549/0175
Patent Assignment
Reel/Frame 027549/0175

Assignment of Assignor's Interest

Recorded: 2012-01-18 Pages: 2
Assignors
URANO, YUTA
Executed: 2011-12-15
MARUYAMA, SHIGENOBU
Executed: 2011-12-15
NAKAO, TOSHIYUKI
Executed: 2011-12-15
HONDA, TOSHIFUMI
Executed: 2011-12-20
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Device and Inspection Method
Patent: 8,599,369 →
Application: 13/378,418 →
Publication: US 2012/0133928
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →