Patent Assignment
Reel/Frame 027665/0725
Assignment of Assignor's Interest
Recorded: 2012-02-07
Pages: 3
Assignors
HAYAKAWA, KOICHI
Executed: 2012-01-26
HIRAI, TAKEHIRO
Executed: 2011-12-05
TANDAI, YUTAKA
Executed: 2011-12-05
ISHIKAWA, TAMAO
Executed: 2011-12-06
SAKAI, TSUNEHIRO
Executed: 2011-12-05
HASUMI, KAZUHISA
Executed: 2011-12-05
NEMOTO, KAZUNORI
Executed: 2011-12-26
ICHINOSE, KATSUHIKO
Executed: 2012-01-11
TAKAGI, YUJI
Executed: 2012-01-20
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Semiconductor Defect Classifying Method, Semiconductor Defect Classifying Apparatus, and Semiconductor Defect Classifying Program
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.