IP Library › Assignment 027787/0850
Patent Assignment
Reel/Frame 027787/0850

Assignment of Assignor's Interest

Recorded: 2012-03-01 Pages: 2
Assignors
YAMANASHI, HIROMASA
Executed: 2012-02-10
SOHDA, YASUNARI
Executed: 2012-01-27
OHASHI, TAKEYOSHI
Executed: 2012-01-27
FUKUDA, MUNEYUKI
Executed: 2012-01-27
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Evaluation Method, Device Therefor, and Electron Beam Device
Patent: 8,816,277 →
Application: 13/386,540 →
Publication: US 2013/0026361
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →