IP Library › Assignment 027795/0114
Patent Assignment
Reel/Frame 027795/0114

Assignment of Assignor's Interest

Recorded: 2012-03-02 Pages: 2
Assignors
CHENG, ZHAOHUI
Executed: 2011-12-29
KOYAMA, HIKARU
Executed: 2012-01-25
KIMURA, YOSHINOBU
Executed: 2012-01-12
SHINADA, HIROYUKI
Executed: 2012-02-01
KOMURO, OSAMU
Executed: 2012-02-08
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Scanning Electron Microscope and Sample Observation Method
Patent: 9,991,092 →
Application: 13/387,183 →
Publication: US 2012/0153145
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →