Patent Assignment
Reel/Frame 027915/0410
Assignment of Assignor's Interest
Recorded: 2012-03-23
Pages: 3
Assignor
FUNADA, TAKESHI
Executed: 2012-02-26
Assignee
SUMCO CORPORATION
2-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8634, JAPAN
Covered Property
(1)
Method of Detecting Specific Defect, and System and Program for Detecting Specific Defect