Patent Assignment
Reel/Frame 027963/0458
Assignment of Assignor's Interest
Recorded: 2012-03-28
Pages: 3
Assignor
ZHAO, YAN
Executed: 2009-06-12
Assignee
HERMES MICROVISION, INC.
5F, NO. 18, CREATION ROAD 1, HSINCHU SCIENCE PARK, HSINCHU, R.O.C., TAIWAN
Covered Property
(1)
Method for Characterizing Identified Defects During Charged Particle Beam Inspection and Application Thereof
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.