Patent Assignment
Reel/Frame 027968/0795
Assignment of Assignor's Interest
Recorded: 2012-04-02
Pages: 4
Assignors
SAKAI, TSUNEHIRO
Executed: 2011-11-24
KURIHARA, SHIGEKI
Executed: 2011-11-24
TANDAI, YUTAKA
Executed: 2011-11-24
ISHIKAWA, TAMAO
Executed: 2011-11-17
HAMAMURA, YUICHI
Executed: 2011-11-22
FUNAKOSHI, TOMOHIRO
Executed: 2011-11-15
ISOGAI, SEIJI
Executed: 2011-11-15
ICHINOSE, KATSUHIKO
Executed: 2011-11-28
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Defect Image Processing Apparatus, Defect Image Processing Method, Semiconductor Defect Classifying Apparatus, and Semiconductor Defect Classifying Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.