IP Library › Assignment 028119/0500
Patent Assignment
Reel/Frame 028119/0500

Assignment of Assignor's Interest

Recorded: 2012-04-27 Pages: 2
Assignors
HITOMI, KEIICHIRO
Executed: 2012-03-28
NAKAYAMA, YOSHINORI
Executed: 2012-04-03
TANAKA, JUNICHI
Executed: 2012-04-16
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Dimension Measurement Method and Charged Particle Beam Microscope Used in Same
Patent: 9,200,896 →
Application: 13/504,129 →
Publication: US 2012/0212602
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →