IP Library › Assignment 028217/0306
Patent Assignment
Reel/Frame 028217/0306

Assignment of Assignor's Interest

Recorded: 2012-05-16 Pages: 2
Assignors
URANO, TAKAHIRO
Executed: 2012-05-11
SAKAI, KAORU
Executed: 2012-05-11
HONDA, TOSHIFUMI
Executed: 2012-01-31
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Device and Defect Inspection Method
Patent: 9,075,026 →
Application: 13/387,369 →
Publication: US 2012/0229618
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →