Patent Assignment
Reel/Frame 028276/0411
Assignment of Assignor's Interest
Recorded: 2012-05-27
Pages: 2
Assignor
WEN, SHENG-YU
Executed: 2012-05-25
Assignee
WISTRON CORP.
21F, NO.88, SEC.1, HSINTAI 5TH RD., HSICHIH, NEW TAIPEI CITY, 22181, TAIWAN
Covered Property
(1)
Method of Measuring Scattering Parameters of Device Under Test