Patent Assignment
Reel/Frame 028289/0730
Confirmatory License
Recorded: 2012-05-30
Pages: 2
Assignor
BAE SYSTEMS, INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC.
Executed: 2012-05-29
Assignee
DEFENSE THREAT REDUCTION AGENCY; DEPT. OF DEFENSE; UNITED STATES GOVERNMENT
8725 JOHN J. KINGMAN RD., STOP 6201, FORT BELVOIR, VIRGINIA, 22060
Covered Properties
(2)
Method and Apparatus for Verifying Stitching Accuracy of Stitched Chips on a Wafer
Two Level Kelvin Test Structure For Electrical Valuation Of Stitching Field Accuracy
Application:
61/346,593 →
Related Assignments
(4)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 15, 2011
From: MCINTYRE, THOMAS J.; ALCORN, CHARLES N.; GREGORY, MATTHEW A.
To: BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC.
Reel/Frame 026909/0491 →
Confirmatory License
Apr 5, 2012
From: BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC.
To: UNITED STATES GOVERNMENT; DEFENSE THREAT REDUCTION AGENCY
Reel/Frame 028002/0574 →
Confirmatory License
May 30, 2012
From: BAE SYSTEMS, INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION, INC.
To: DEFENSE THREAT REDUCTION AGENCY; DEPT. OF DEFENSE; UNITED STATES GOVERNMENT
Reel/Frame 028289/0745 →
Confirmatory License
May 30, 2012
From: BAE SYSTEMS, INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION, INC.
To: DEFENSE THREAT REDUCTION AGENCY; DEPT. OF DEFENSE; UNITED STATES GOVERNMENT
Reel/Frame 028289/0776 →