IP Library › Assignment 028497/0287
Patent Assignment
Reel/Frame 028497/0287

Assignment of Assignor's Interest

Recorded: 2012-07-06 Pages: 2
Assignors
OTANI, YUKO
Executed: 2012-05-14
TACHIZAKI, TAKEHIRO
Executed: 2012-05-24
WATANABE, MASAHIRO
Executed: 2012-05-14
MATSUMOTO, SHUNICHI
Executed: 2012-05-17
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Detection Method and Defect Detection Device and Defect Observation Device Provided with Same
Patent: 8,953,156 →
Application: 13/510,300 →
Publication: US 2012/0274931
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →