Patent Assignment
Reel/Frame 028524/0033
Assignment of Assignor's Interest
Recorded: 2012-07-10
Pages: 3
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Method of Determining a Spring Constant of a Cantilever and Scanning Probe Microscope Using the Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.