IP Library Assignment 028533/0210
Patent Assignment
Reel/Frame 028533/0210

Assignment of Assignor's Interest

Recorded: 2012-07-12 Pages: 5
Assignors
YOKHIN, BORIS
Executed: 2010-01-03
MAZOR, ISAAC
Executed: 2010-01-03
KROHMAL, ALEXANDER
Executed: 2010-01-03
GVIRTZMAN, AMOS
Executed: 2010-01-03
OPENGANDEN, GENNADY
Executed: 2010-01-03
BERMAN, DAVID
Executed: 2010-01-03
WORMINGTON, MATTHEW
Executed: 2010-01-05
Assignee
JORDAN VALLEY SEMICONDUCTORS LTD.
P.O. BOX 103, MIGDAL HAEMEK, 23100, ISRAEL
Covered Property (1)
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensitivity
Patent: 8,731,138 →
Application: 13/547,073 →
Publication: US 2012/0281814
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Apr 13, 2021
From: JORDAN VALLEY SEMICONDUCTORS LTD.
To: BRUKER TECHNOLOGIES LTD.
Reel/Frame 055994/0565 →